EasyReport is aimed to acquire devices characteristics in conjunction with Microsoft® Excel.

Its simplicity offers great flexibility (commands written simply inside Excel sheets). At run time, each step of the measurement sequence is specified and updated on the displayed Excel sheet. Therefore, any setting of the process can be modified and immediately tested.

Using EasyReport, we have developed several device characterization programs, which are used for on-site measurement within aging test benches. (FET & HBT RF transistors, laser diodes...)

 


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